Design and Comparison of Low Power High Performance Online Testable Combinational Circuits with Different Reversible Logic Gates
Citation
Ranjusha K, Remya K P, Salmanul Faris "Design and Comparison of Low Power High Performance Online Testable Combinational Circuits with Different Reversible Logic Gates", International Journal of Engineering Trends and Technology (IJETT), V47(3),132-138 May 2017. ISSN:2231-5381. www.ijettjournal.org. published by seventh sense research group
Abstract
In current scenario, the reversible logic
design attracting more interest due to its low power
consumption. Reversible logic is very important in
low-power VLSI design,quantum computing,
nanotechnology and optical computing. In this
paper, a new 4*4 reversible gate termed OTG
(Online Testable Gate) and CTSG are proposed
suitable for online testability in reversible logic
circuits. OTG can also work singly as a reversible
full adder with a bare minimum of two garbage
outputs. OTG is shown better than the recently
proposed R1 gate (introduced for providing online
testability in reversible logic circuits), in terms of
computation complexity. The proposed reversible
gate is combined with the existing 4*4 Feynman gate
to design online testable reversible adders such as
ripple carry adder, carry skip adder and BCD adder
and 4*1 Multiplexers and De Multiplexers. The
important reversible gates used for reversible logic
synthesis are Feynman Gate, Fredkin gate, toffoli
gate, New Gate, DKG Gate and peres gate etc. The
proposed system is the design of basic reversible
gate and comparison of leakage power, dynamic
power, total power. The testable reversible circuits
proposed in this work are shown to be better than
the recently proposed testable designs in terms of
number of reversible gates, garbage outputs and unit
delay.The reversible logic circuits are designed and
implemented using VHDLcode. The synthesize and
simulation results are obtained in Xilinx ISE version
10.1i and MODEL SIM 6.4a.
References
[1] Landauer, R., 1961. Irreversibility and heat generation in
the computing process. IBM J. Res. Develop., 5: 183-191.
[2] C.H. Bennett, ?Logical Reversibility of Computation?,
IBM J.Research and Development, 17, 525 (1973).
[3] D.P. Vasudevan , P.K. Lala and J.P. Parkerson, ?Online
Testable Reversible Logic Circuit Design using NAND
Blocks?, Proc, Symposium on Defect and Fault Tolerance,
October 2004, pp-324-331.
[4] D. P. Vasudevan, P. K. Lala, J. P Parkerson, ?Reversible-
Logic Design With Online Testability?, IEEE Transactions
on Instrumentation and Measurement, VOL. 55, NO. 2, pp.
406-414, APRIL 2006.
[5] E. Fredkin, T Toffoli, ?Conservative Logic?, International
Journal of Theor. Physics, vol. 21, nos. 3-4, pp. 219-253,
1982.
[6] T. Toffoli., ?Reversible Computing?, Tech memo
MIT/LCS/TM-151, MIT Lab for Computer Science (1980).
[7] K. N. Patel, J. P. Hayes, and I. L. Markov, ``Fault Testing
for Reversible Circuits``, IEEE Trans. on CAD, 23(8), pp.
1220-1230, August 2004.
[8] P.O. Boykin and V.P. Roychowdhury, "Reversible faulttolerant
logic" Proceedings International Conference on
Dependable Systems and Networks, 2005 ( DSN 2005), 28
June-1 July 2005.
[9] Avishek Bose, Hafiz Md. Hasan babu, Shalini Gupta,
Design of Compact Reversible Online Testable Ripple
carry order” IEEE WIECON-ECE Dec 2015.
[10] Nagarjun S, Nagendra R, Kiran N, Kiran Kumar K N,
Designand Comparison of Reversible and Irreversible
Sequential Logic Circuits, IJRAET, Volume-2, Issue -4,
2014.
[11] B.Raghu kanth, B.Murali Krishna, M. Sridhar, V.G. Santhi
Swaroop ?A DISTINGUISH BETWEEN REVERSIBLE
AND CONVENTIONAL LOGIC GATES ?, International
Journal of Engineering Research and Applications (IJERA)
ISSN: 2248-9622 www.ijera.com Vol. 2, Issue 2,Mar-Apr
2012, pp.148-151
[12] Raghava Garipelly, P.Madhu Kiran, A.Santhosh Kumar ?A
Review on Reversible Logic Gates and their
Implementation? International Journal of Emerging
Technology and Advanced Engineering Website: (ISSN
2250-2459, ISO 9001:2008 Certified Journal, Volume 3,
Issue 3, March 2013)
[13] Punam Prabhakar Bhalerao,Sameena Zafar ?New Design
For Obtain Fault Tolerant Logic Gate Using Quantum –Dot
Cellular Automata? International Journal of Science and
Research (IJSR) Volume 3,Issue 7,July 2014
[14] A COMPARITIVE STUDY OF REVERSIBLE LOGIC
GATES, International Journal of VLSI & Signal
Processing Applications, Vol.2,Issue 1, Feb 2012, (51-55),
ISSN 2231-3133.
[15] https://en.wikipedia.org/wiki/Reversible Computing
Keywords
Garbage outputs, Online Testable
Gate(OTG), Power consumption, Reversible logic
circuits, CTSG, Feynman Gate, Fredkin gate, Toffoli
gate, DKG Gate, Peres Gate and Xilinx ISE version
10.1i and MODEL SIM 6.4a.