Investigation of Duty Cycle Distortion in Clock Channels with Infinisim Clockedge Technology
Investigation of Duty Cycle Distortion in Clock Channels with Infinisim Clockedge Technology |
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© 2022 by IJETT Journal | ||
Volume-70 Issue-4 |
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Year of Publication : 2022 | ||
Authors : Sumitha Manoj, Dr. R. Surendiran |
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DOI : 10.14445/22315381/IJETT-V70I4P238 |
How to Cite?
Sumitha Manoj, Dr. R. Surendiran, "Investigation of Duty Cycle Distortion in Clock Channels with Infinisim Clockedge Technology," International Journal of Engineering Trends and Technology, vol. 70, no. 4, pp. 457-464, 2022. Crossref, https://doi.org/10.14445/22315381/IJETT-V70I4P238
Abstract
Infinisim has developed a dynamic clock analysis tool, clock edge Simulated Program with Integrated Circuit Emphasis (SPICE) provides accurate results at very high speed and full-chip capacity. The real-time adaptive simulation technology of RASER makes the simulation fast and accurate. Clock edge overcomes the limitations of Static Timing Analysis (STA) and provides the designer with accurate timing analysis, accurate power and leakage data, and On-Chip Variation (OCV) analysis. For accurate analysis of jitters in clock edges, Infinisim clock edge uses SPICE models instead of the .libs method. Earlier days, Prime Time (PT) was used with .libs to calculate the Jitter and delay. This investigation calculates the Duty Cycle Distortion (DCD) of clock sources using Infinisim clock edge. From the final observed results, it was found that the duty cycle is not to be varied as in the case of clock edge by synopsis prime time tool, and the results were found for only 50% duty cycle; hence the analysis also did not as accurate as clock edge.
Keywords
Duty Cycle Distortion, Placement, and Routing (PnR), On Chip Variation, Node Based Framework (NBF), Static Timing Analysis, Prime Time, Infinisim Clock edge.
Reference
[1] Te Liang, Zaiming Fu, Hanglin Liu, Ke Liu, and Yindong Xiao, Minimizing the Jitter of Duty Cycle Distortion Correction Technology Based on Cross Point Eye Diagram Correction, IEEE Access, 99 (2019) 1-10.
[2] W.J. Yun, A 0.1 to 1.5 GHz 4.2 mW All-Digital DLL with Dual Duty-Cycle Correction Circuit and Update Gear Circuit for DRAM in 66 Nm CMOS Technology, IEEE International Journal of Solid-State Circuits, (2008) 282-283.
[3] J. S. Wang, C. Y. Cheng, J. C. Liu, Y. C. Liu, and Y. M. Wang, A duty-Cycle-Distortion-Tolerant Half-Delay-Line Low-Power FastLock-In all-Digital Delay-Locked Loop, Journal of Solid-State Circuits, 45(5) (2010) 1036-1047.
[4] Chaithanya Supe, Real-Time Implementation of Circuits, IEEE International Conference on Advances in Vision Computing, 1(4) (2014) 436-442.
[5] V. Ramadesigan, P. W. C. Northrop, S. De, S. Santhanagopalan, R. D. Braatz, and V. R. Subramanian, Modeling and Simulation of Lithium-Ion Batteries from a Systems Engineering Perspective, Journal of the Electrochemical Society, 159(3) (2012) 31-45.
[6] S. Sepasi, R. Ghorbani and B.Y. Liaw, A Novel on Board SOC Estimation Method for Aged Li-Ion Batteries Based on Model Adaptive EKF, Journal of Power Sources, 245 (2014) 337-344.
[7] F. Anceau, A Synchronous Approach for Clocking VLSI Systems, IEEE International Journal of Solid-State Circuits, 17 (2016) 51-56.
[8] Sarfati, B. Frankel, Y. Birk, and S. Wimer, Optimal VLSI Delay Tuning by Space Tapering with Clock-Tree Application, IEEE Transactions on Circuits and Systems-I, 64(8) (2017) 2160-2170. Doi: 10.1109/TCSI.2017.2695100.
[9] Y. Kaplan and S. Wimer, Mixing Drivers in Clock-Tree for Power Supply Noise Reduction, IEEE Transactions on Circuits and Systems, 62(5) (2015) 1382-1392.
[10] Chunchun Sui, Siqi Bai, Ting Zhu, Christopher Cheng, and Daryl G. Beetner, New Methods to Characterize Deterministic Jitter and Crosstalk-Induced Jitter from Measurements, IEEE Transactions on Electromagnetic Compatibility, 57 (2015) 877-884.
[11] Yi Cai, Bernd Laquai and Kent Luehman, Jitter Testing for Gigabit Serial Communication Transceivers, IEEE Design and Test of Computers, 9(1) (2002) 66-74.
[12] Zamek, and Zamek, Definitions of Jitter Measurement Terms and Relationships, Test, 10 (2005) 28-34.
[13] J. Balcarek, P. Fiser, and J. Schmidt, Duty Cycle Distortion in Clock Based Networks in Digital System Design (DSD), 13th Euro micro-Conference on Architectures, Methods and Tools, (2010) 805-808.
[14] M. Ali Altunchu, Taner Guven, Yasar Becerikli, and Suhap Sahin, Analysis of Clock Edges on Digital Circuits, International Journal of Information and Electronics Engineering, 5(6) (2015) 345-349.
[15] M.A.Franklin and D.F.Wann, Asynchronous and Clocked Control Structures for VLSI Based Interconnection Networks, ProceedingsSymposium on Computer Architecture and High-Performance Computing, (2011) 50-59.
[16] V. Adler and E. G. Friedman, Repeater Design to Reduce Delay and Power in Resistive Interconnect, IEEE Transactions on Circuits and Systems-II, 45 (2016) 607-616.
[17] Somasekhar and V. Visvanathan, A 230-MHz Half-Bit Level Pipelined Multiplier using True Single-Phase Clocking, IEEE Transactions on VLSI Systems, 1 (2013) 415-422.
[18] Gijin Park, Jaeduk Han, and Woorham Bae, Design and Analysis of Asynchronous Sampling Duty Cycle Corrector, Electronics, 10 (2021) 2594-2599.
[19] Kao, Design, and Implementation of Fast Locking All-Digital Duty Cycle Corrector Circuit with Wide Range Input Frequency, Electronics, 10 (2021) 71-76.
[20] Hamzaoglu and J. Patel, Reducing Jitter Application Time for Embedded Cores, 29th Annual International Symposium on Jitter Applications, (2009) 260-267.
[21] Surendiran. R, and Alagarsamy. K, Privacy Conserved Access Control Enforcement in MCC Network with Multilayer Encryption". IJETT International Journal of Engineering Trends and Technology (IJETT), 4(5) (2013) 2217-2224.
[22] Gavaskar, S., Surendiran, R. and Ramaraj, D.E., Three counter defense mechanism for TCP SYN flooding attacks. International Journal of Computer Applications, 6(6) (2010) 0975-8887.
[23] Subburaj.V, Srinivasan.M, Surendiran. R , Sundaranarayanan. R. DDoS Defense Mechanism by Applying Stamps using Cryptography. International Journal of Computer Applications. 1(6), ISSN: 0975 – 8887, (2010) 48-52. DOI: 10.5120/143-262.